Key Responsibilities
Define and drive DFT plans for signal-conditioning products supporting high-speed connectivity and advanced multi-die packaging.
Develop test-access, coverage, observability, and diagnostic strategies for die-to-die interfaces, interposers, and package-level integration.
Lead implementation and verification of scan, ATPG, compression, memory BIST, boundary scan, and related DFT features while balancing area, timing, routing, and manufacturability.
Work with Design, STA and Physical Design teams to accurately craft constraints, placement and design structures needed to implement DFT
Set coverage targets, review ATPG results and pattern quality, and influence test-time and production economics.
Support tape-out, wafer sort, packaged-device test, silicon bring-up, characterization, and production ramp.
Collaborate with product, manufacturing, assembly, and test teams on yield learning, failure analysis, and root-cause resolution.
Build pre-bond, post-bond, and package-level test approaches that enable known-good-die screening.
Diagnose DFT integration and tool-related failures and resolve issues cross-functionally.
Mentor engineers and contribute to building DFT capabilities in the team.
Partner with OSATs, ATE vendors, packaging partners, and internal stakeholders; communicate risks and trade-offs clearly.
Required Qualifications
Bachelor's degree in Electrical Engineering, Computer Engineering, or a related field.
Minimum 8 years of relevant DFT or semiconductor design-and-test experience.
Demonstrated expertise in boundary scan, memory BIST (MBIST), and automatic test pattern generation (ATPG).
Hands-on experience with DFT/EDA tools for test insertion, pattern generation, verification, or diagnostics.
Solid understanding of the ASIC design flow, from RTL through GDS and DFT signoff.
Working knowledge of 2.5D/3D packaging techniques, backside bus implications for test and diagnosis, and DFT methodologies for 3D designs.
Strong analytical and problem-solving skills, with the ability to independently troubleshoot unfamiliar DFT integration and tool-related challenges.
Familiarity with high-speed interface or advanced packaging test concepts.
Preferred Qualifications
Master's degree or PhD in Electrical Engineering, Computer Engineering, or a related field.
Working knowledge of multi-die or chiplet DFT experience
Experience with advanced packaging technologies and known-good-die strategies.
Knowledge of relevant IEEE and JEDEC standards for multi-die and boundary-scan testing.
Experience with RTL design, static timing analysis (STA), or physical implementation considerations related to DFT.
Experience with high-speed interface testing, including PCIe, Ethernet, or SerDes.
Familiarity with ATE platforms, wafer probe, OSAT engagement, production testing, and yield analysis.
Salary range is $165,000 CAD to $210,000 CAD depending on experience, level, and business need. This role may be eligible for discretionary bonus, incentives and benefits.
We know that creativity and innovation happen more often when teams include diverse ideas, backgrounds, and experiences, and we actively encourage everyone with relevant experience to apply, including people of color, LGBTQ+ and non-binary people, veterans, parents, and individuals with disabilities.